This microscope offers high-resolution imaging with over 50 AFM modes
Scientific instrument manufacturer Bruker Corporation has launched the Dimension Nexus atomic force microscope (AFM).
“With the release of Nexus, we have taken a significant step in making the latest AFM technology available to a wider research community,” said Bruker senior director of AFM Instrumentation Thomas Mueller. “Its combination of data quality, performance, and versatility make it both an excellent starter AFM and an addition to an AFM lab.”
The microscope’s 150 mm open-access programmable stage supports a variety of capabilities, including mapping of nanomechanical properties of polymers and characterising graphene, moiré superlattices and other 2D materials at the nanoscale.
This newest addition to the Dimension AFM product line offers wider access to Bruker’s PeakForce Tapping technology, where the probe periodically taps the sample and the pN-level interaction force is measured directly by the deflection of the cantilever. This allows the operator to precisely control probe-to-sample interaction.
With the NanoScope 6 controller, the microscope features high speeds, low noise and greater AFM mode flexibility, with over 50 AFM modes.
For imaging occurring over a long period of time, Nexus exhibits minimal drift and over long scan lengths, the system shows no scanner artifacts or tip degradation.
Earlier this year, Bruker released several new products that enhance clinical microbiology and infection diagnostics.
